The discharge event causes the damage. There are a couple of models - human
body and machine - used to evaluate component "hardness". I am not aware of
any standards that attempt to predict damage in terms of field strength or
proximity to fields. I can't make sense of the question. I am trying to
imagine how big the field would have to be to kick enough electrons off a
component, passing through said field,  to damage the component. Where would
they go? When would the component be subject to damage?

Oouch - I think I hurt myself. Better get back to  . . . I forgot what I was
doing.

> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]] On Behalf Of Kathy Kuhlow
> Sent: Tuesday, June 08, 2004 8:53 AM
> To: [log in to unmask]
> Subject: Re: [TN] TechNet Digest - 4 Jun 2004 to 6 Jun 2004
> (#2004-149)
>
> I am sure someone here will come through with a standard but
> couldn't you take a field meter and make up your own
> evaluation?  That way both of you would be able to see and
> evaluate the results.
>
> Kat
>
>
> >>> [log in to unmask] 06/07/04 06:04PM >>>
> TechNeters
>
> I am looking for collaborative feedback on an in house vexing issue.
>
> I am in discussions with our in-house ESD gooroo about the
> sensitivity of standard reeled smd capacitors and resistors
> in relation to static fields (rather than ESD damage caused
> by direct or in circuit contact).
>
> I store these devices in much the same way we receive them
> (under the supposition that the manufacturer should be an
> ideal source of knowledge on the way the product they make
> should be stored).
>
> Can anyone point me to a source of information that
> demonstrates if and how reeled devices, still on the reel,
> are affected by ESD fields and should they be stored/moved in
> shielded bags. (I have a paper from Kemet but it seems to
> relate to contact ESD damage research.)
>
> Mike Hughes
> Purchasing Manager
> CEA Technologies
> Canberra, Australia

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