TGASIA Archives

March 2010

TGAsia@IPC.ORG
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Subject:
Re: CAF testing
From:
Nancy Deng <[log in to unmask]>
Reply To:
Asia Committe Task Group Forum <[log in to unmask]>, Nancy Deng <[log in to unmask]>
Date:
Wed, 17 Mar 2010 09:08:27 +0800
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CAF: conductive anodic filament: 离子迁移/阳极丝传导试验
CAF 的发生，将使导体间的绝缘性能下降，严重时引起电路功能失效，电路短路，严重影响产品的可靠性。

Best regards and thanks
Nancy Deng

From: TGAsia [mailto:[log in to unmask]] On Behalf Of 孙该贤
Sent: 2010年3月16日 9:12
To: [log in to unmask]
Subject: [TGAsia] CAF testing

请教大家一个问题,什么是CAF testing?

Sunny Sun
Quality Dept
Amphenol
Guangzhou Amphenol Sincere Flex Circuits
Tel: 86-20-3483-9838
Fax: 86-20-3483-9800
Mobil: 13798074592
Email: [log in to unmask]<mailto:[log in to unmask]>




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