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February 2017

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TechNet <[log in to unmask]>
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TechNet E-Mail Forum <[log in to unmask]>, "[log in to unmask]" <[log in to unmask]>
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Tue, 7 Feb 2017 14:27:16 +0000
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TechNet E-Mail Forum <[log in to unmask]>, Jose A Rios <[log in to unmask]>
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Re: XRF analysis
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Jose A Rios <[log in to unmask]>
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Absolutely, provided a proper calibration for it is established.
I’m pretty sure how to go about it is described in IPC 4556 (either in the body of the document or in one of its Appendices).


José (Joey) Ríos, Sr QA Engineer
Mission Assurance
Kavli Institute for Astrophysics & Space Research
Massachusetts Institute of Technology
[log in to unmask] <mailto:[log in to unmask]>
(617)324-6272



> On Feb 7, 2017, at 9:14 AM, [log in to unmask] wrote:
> 
> Fellow TekNetters:
> 
>   Can Palladium, Pd, be identified in an alloy mixture such as Ni/Pd with a Fischer scope XRF Instrument?   I have detected Pd as a layer by itself in the past.
> 
> Victor,

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