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Date: | Fri, 29 May 2009 13:01:07 -0400 |
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Xps with various incidence angle? Ftir with monitoring of ch peak? You need good reference as base line. Old days, spend 1wk to "clean" base metal use hot freon just to get the good base line for ftir. Pain! Auger with glancing angle might work too. You have to get a quantum well specimen as sputtering refernce for thickness. I am sure ericsson has some of chip some where in the desk draw. No easy way. Enjoy!
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----- Original Message -----
From: TechNet <[log in to unmask]>
To: [log in to unmask] <[log in to unmask]>
Sent: Fri May 29 10:33:48 2009
Subject: [TN] WAX
Hi all and even Bev,
Assume that you polish a metal, in my case five 9s Ag. Polishes have at
least two purposes. Grind the metal to get a certain level of brightness (we
polish to Ra 30 nanometers). And leave a thin coating that protects the
metal. Now, in our case, what is left is so thin, that you can't observe the
'coating'. Presumably because it's an organic compound of some sort, and
also because it's transparent for our eye's wavelength. Now comes the
question: has anyone out there ever investigated such a 'wax' and
determined the thickness, and if so, what kind of equipment was used?
That's why I more or less directed the q to Bev...
Inge
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