All,

It is widely understood that ESD can be extremely destructive to sensitive
components - such as EEPROMs.


My question is this:  Once an EEPROM has been placed, reflowed, tested,
programmed - and let's say is then introduced to some strong ESD - what sort
of evidence will prove that a future failure is attributable to ESD?  Will
the data in the EEPROM be corrupted?  Is there a way to tell?  Is there an
experiment that can be suggested?  Is there documentation out there that
describes the aftermath of a static shock on an EEPROM?


I, on occasion, receive RMA modules back that show evidence of some
programming, but the data has obviously been corrupted at some point and I
am trying to ascertain whether or not it could be an ESD issue (some
customer's ESD practices are at best - questionable) or possibly a
test/programming related issue...  maybe even both.


All help, documents, suggestions, ideas, etc will be appreciated.





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