All,
It is widely
understood that ESD can be extremely destructive to sensitive
components - such as EEPROMs.
My question is
this: Once an EEPROM has been placed, reflowed, tested, programmed - and
let's say is then introduced to some strong ESD - what sort of evidence will
prove that a future failure is attributable to ESD? Will the data in the
EEPROM be corrupted? Is there a way to tell? Is there an experiment
that can be suggested? Is there documentation out there that describes the
aftermath of a static shock on an EEPROM?
I, on occasion,
receive RMA modules back that show evidence of some programming, but the data
has obviously been corrupted at some point and I am trying to ascertain whether
or not it could be an ESD issue (some customer's ESD practices are at best -
questionable) or possibly a test/programming related issue... maybe even
both.
All help, documents,
suggestions, ideas, etc will be appreciated.
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