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1995

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Subject:
From:
Lee Bab Kieng <[log in to unmask]>
Date:
Wed, 20 Sep 1995 06:13:35 +0800 (SST)
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	Does anyone has experience in using Quartz Crystal Microbalance 
(QCM) Technology in measuring electroless/electroplating thickness? Will 
appreciate if you could share with me the reliabilty or shortcomings of 
this technology. Thanks in advance.

B.H.Lee
Process Engineer



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