Hi Chetan,
I was approached this week during IPCWorks about the formation of a task
group on the reliability of plated-through holes (PTHs) and vias (PTVs) in
multilayer flex and flex-rigid circuits. This directly would address your
recent concern regarding the PTV reliability and the appropriatness of using
T-stress testing. Would you, and anybody else interested in this, please
contact Sarah Zarrin, Seagate Technology, 612-402-3661, fax 612-402-2044,
[log in to unmask] She volunteered to chair such an activity.

Werner Engelmaier
Chairman, IPC Reliability Main Committee

##############################################################
TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c
##############################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in
the body:
To subscribe:   SUBSCRIBE TECHNET <your full name>
To unsubscribe:   SIGNOFF TECHNET
##############################################################
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional
information.
If you need assistance - contact Gayatri Sardeshpande at [log in to unmask] or
847-509-9700 ext.5365
##############################################################