Hi Chetan, I was approached this week during IPCWorks about the formation of a task group on the reliability of plated-through holes (PTHs) and vias (PTVs) in multilayer flex and flex-rigid circuits. This directly would address your recent concern regarding the PTV reliability and the appropriatness of using T-stress testing. Would you, and anybody else interested in this, please contact Sarah Zarrin, Seagate Technology, 612-402-3661, fax 612-402-2044, [log in to unmask] She volunteered to chair such an activity. Werner Engelmaier Chairman, IPC Reliability Main Committee ############################################################## TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c ############################################################## To subscribe/unsubscribe, send a message to [log in to unmask] with following text in the body: To subscribe: SUBSCRIBE TECHNET <your full name> To unsubscribe: SIGNOFF TECHNET ############################################################## Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional information. If you need assistance - contact Gayatri Sardeshpande at [log in to unmask] or 847-509-9700 ext.5365 ##############################################################