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October 1999

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Sender:
TechNet <[log in to unmask]>
Subject:
ICT Test Pin Attributes
From:
Dave Hoover <[log in to unmask]>
Date:
Mon, 11 Oct 1999 13:47:26 -0700
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"TechNet E-Mail Forum." <[log in to unmask]>, Dave Hoover <[log in to unmask]>
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Curious about what designers are using now for
ICT test pin location access pad size (S/M also)
along with closest distance between two test points.
(Of course those flying probe ICT 's can bend
major rules but I'm thinking standard fixture/high
volume.)


David Hoover

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