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Date: | Fri, 20 Aug 1999 07:15:59 -0700 |
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Hi all,
I would like to hear from anyone who can estimate their manufacturing
yield impact due to failure of chip capacitors, i.e. due to cracks,
leakage, etc. I have been doing failure analysis on these types of part
issues and I am trying to benchmark expected yield and/or failure rates
under "normal" conditions.
Any help would be sincerely appreciated!
Best Regards,
Ed Hare
--
SEM Lab, Inc.
Scanning Electron Microscopy and Failure Analysis
Snohomish, WA
(425)335-4400
http://www.sem-lab.com
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