Hi all,

I would like to hear from anyone who can estimate their manufacturing
yield impact due to failure of chip capacitors, i.e. due to cracks,
leakage, etc.  I have been doing failure analysis on these types of part
issues and I am trying to benchmark expected yield and/or failure rates
under "normal" conditions.

Any help would be sincerely appreciated!

Best Regards,
Ed Hare
--

               SEM Lab, Inc.
Scanning Electron Microscopy and Failure Analysis
               Snohomish, WA
               (425)335-4400
           http://www.sem-lab.com

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