Hi all, I would like to hear from anyone who can estimate their manufacturing yield impact due to failure of chip capacitors, i.e. due to cracks, leakage, etc. I have been doing failure analysis on these types of part issues and I am trying to benchmark expected yield and/or failure rates under "normal" conditions. Any help would be sincerely appreciated! Best Regards, Ed Hare -- SEM Lab, Inc. Scanning Electron Microscopy and Failure Analysis Snohomish, WA (425)335-4400 http://www.sem-lab.com ############################################################## TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c ############################################################## To subscribe/unsubscribe, send a message to [log in to unmask] with following text in the body: To subscribe: SUBSCRIBE TECHNET <your full name> To unsubscribe: SIGNOFF TECHNET ############################################################## Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional information. If you need assistance - contact Gayatri Sardeshpande at [log in to unmask] or 847-509-9700 ext.5365 ##############################################################