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Reply To: | TechNet E-Mail Forum. |
Date: | Wed, 17 Feb 1999 18:16:51 -0500 |
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From this would you expect that (holding all other varaibles constant) you
would get a thicker IMC layer on the final solder joint with thin HAL boards
than with more normal, thicker HAL?
> -----Original Message-----
> From: [log in to unmask]
> [SMTP:[log in to unmask]]
> Sent: Wednesday, February 17, 1999 11:59 AM
> To: [log in to unmask]
> Subject: Re: [TN] Intermetalics
>
>
> It would not be at all unexpected to observe a higher relative
> concentration of tin in an area determined to have a "thin" HAL deposit.
> The XRF is responding to the ratio of tin to lead, and given you are
> approaching the copper/solder interface, and more specifically the
> tin/copper interface, it would be naturally preferential to tin
> concentration.
>
> Sounds like you are within expected conditions, other than the thin solder
> deposits. May I assume they are on larger ground areas? There is a direct
> correlation between deposit thickness and area size under given conditions
>
> Hope this helps!
>
> Joseph Webb
> TET/Halco
>
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