Hi everyone,
I just managed to dig through all the stuff on my desk and find the April issue of CircuiTree. Among the articles there was one about IST (=Interconnect Stress Test) written by Bill Birch. Among other things he wrote that the IST will be in the next IPC-TM-650.

My questions to you: 
- Does anybody have any experience with this test and is willing to share the knowledge ? 
- I understand that this method is supposed to allow a good distinction between PTH failures and interconnect failures (post separations), is that really so?. 
- Where can I find guidelines for designing a test method for IST?

Thanks,
Yehuda

    ************************************* 
    *          Yehuda E. Weisz              
    *  e-mail: [log in to unmask]
    *  Tel: 972-3-5240362                    
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