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Date: | Fri, 11 Jul 1997 08:59:25 -0400 (EDT) |
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Dave,
in your reply you recommend the use of Scanning Electron Microscopy analysis
techniques. As far as I know there are some methods available - single point,
areal
and others, depending on the required analysis resolution. Talking about a
final
composition of Sn/Pb/Ag (even some small zones only) what analysis technique
would be recommendable ? Furthermore, any recommendations for Solder Joint
Reliability Testing?
Regards,
Christian
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