TECHNET Archives

1995

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Condense Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Received:
by ipchq.com (Smail3.1.28.1 #2) id m0sWoeP-0000GoC; Fri, 14 Jul 95 12:35 CDT
Old-Return-Path:
<miso!aol.com!SIRGuru>
Date:
Fri, 14 Jul 1995 13:10:48 -0400
Precedence:
list
Resent-From:
Cc:
X-Status:
Status:
O
X-Mailing-List:
<[log in to unmask]> archive/latest/701
TO:
Return-Path:
Resent-Message-ID:
<"iYUty.0.YaG.khg1m"@ipc>
Subject:
From:
Resent-Sender:
X-Loop:
From [log in to unmask] Sat Apr 27 14:
23:50 1996
Message-Id:
Parts/Attachments:
text/plain (15 lines)
Rory,

I would say that, no, it is not possible to get electromigration in an
unbiased test.  For electromigration to occur you need three elements: an
electrical potential, water, and a conductive contaminant.  Electrochemical
migration occurs when this conductive contaminant mixes with water (only a
few monolayers needed).  I would guess that you have a flux contamination
problem and the lead is re-deposited rather than migrated.

Doug Pauls
Contamination Studies Laboratories
317-457-8095



ATOM RSS1 RSS2