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June 2008

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Subject:
From:
Tan Geok Ang <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Tan Geok Ang <[log in to unmask]>
Date:
Fri, 27 Jun 2008 16:22:12 +0800
Content-Type:
text/plain
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text/plain (39 lines)
Hi All,
	Base on the table 4.4 from IPC-9701 the definition for:-
	Failure Definition: 
	a)	Event detector, 1000ohms, 10 events (maximum), 1
micro-second 		duration (maximum), report first verified as
time-to-failure
					AND/OR

	b)	Data logger/voltmeter 20% nominal resistance increase
(maximum), five readings/scans (maximum).

Currently, we are using data logger to determine/filter the failure.
From one of the lab, they recommend a failure is defined by 300ohms/10
events (maximum), 1msec duration (maximum). Is this an acceptable
standard?

For item (b), "five readings/scans (maximum)", 
Base on IPC 9701, using a data logger to scan interval durations of less
than 1 minute is mandated. -- Am I right that with a data logger scan
time less than 1 minute, it is considered a failure with 5 scans more
than 20% nominal resistance increase (maximum)?


	Thanks!

Best Regards
GA Tan


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