Hi Graham,
Would you please send me a copy of IEC 61189-5.
Best Regards,
Joe Russeau
E: [log in to unmask]
----- Original Message -----
From: "Graham Naisbitt" <[log in to unmask]>
To: <[log in to unmask]>
Sent: Monday, March 13, 2006 8:12 AM
Subject: Re: [TN] SIR spacing
> Joyce
>
> That is waaayyyy too sensible for a Friday!
>
> I would like to run the same here and share the results...
>
> ...and oh boy., a challenge to SIR Doug: Whilst Doug is absolutely correct
> that there are no prevailing standards or specifications, there are drafts
> awaiting publication notably IEC - The International Electro-Technical
> Commission INTERNATIONAL Standard IEC 61189-5. I can again send anyone a
> copy if they let me know.
>
> However, there is a huge amount of data published by the NPL and ourselves
> that not only show where the present specs are suspect but, the EU
Consortia
> that included NPL, Siemens and NMRC ran a round-robin test programme
showing
> excellent correlation of data between their 3 sites using 3 different
> measurement systems.
>
> You would not be left "high and dry".
>
> --
> Regards Graham Naisbitt
>
> [log in to unmask]
>
> GEN3 SYSTEMS LIMITED (Formerly Concoat Systems)
> Unit B2 Armstrong Mall
> Southwood Business Park
> Farnborough, Hampshire GU14 0NR
>
> Phone: +44 (0)12 5252 1500
> Fax: +44 (0)12 5252 1112
>
> www.gen3systems.com
>
>
>
>
> On 9/3/06 19:58, "Joyce Koo" <[log in to unmask]> wrote:
>
> > Doug, Grraham and all other gurus, Many thanks for all your help. I
think I
> > am going to test both...new and old...jk (zap, zap)
> >
> >
> > -----Original Message-----
> > From: TechNet [mailto:[log in to unmask]]On Behalf Of Douglas O. Pauls
> > Sent: Thursday, March 09, 2006 9:15 AM
> > To: [log in to unmask]
> > Subject: Re: [TN] SIR spacing
> >
> >
> > Joyce,
> > For the new methods, it is not so much a case of obsolete or
insufficient
> > as they are not yet accepted, nor are any of the standards which call
out
> > such test methods revised to call out the new methods. So, if you run
the
> > new test, you won't have criteria or a specification against which to
test.
> >
> > Doug Pauls
> >
> >
> >
> >
> > Joyce Koo
> > <[log in to unmask]
> > COM>
To
> > Sent by: TechNet [log in to unmask]
> > <[log in to unmask]>
cc
> >
> >
Subject
> > 03/09/2006 08:01 Re: [TN] SIR spacing
> > AM
> >
> >
> > Please respond to
> > [log in to unmask]
> > om
> >
> >
> >
> >
> >
> >
> > Excellent! this is exactly what I am looking for. Jack and Doug, is
any
> > possiblity to get access the proposed new test method as "review
version"?
> > Hate to run test ($$$) and find out it is "obsolete or insufficient" by
> > gurus (never argue with someone that is superior than me either
physically
> > or mentally..;-)
> >
> > jk
> > ps: Doug, you are right, Sandia is a brickwall..either by phone or
e-mail..
> > I guess they finger it out I do not have million $s just look at the
phone
> > number..;-(
> >
> > -----Original Message-----
> > From: TechNet [mailto:[log in to unmask]]On Behalf Of Graham Naisbitt
> > Sent: Thursday, March 09, 2006 6:21 AM
> > To: [log in to unmask]
> > Subject: Re: [TN] SIR spacing
> >
> >
> > Hi Joyce
> >
> > There is a new IPC-TM-650 2.6.3.7 spec due to be released soon that
> > introduces a far more relevant test protocol to help characterise a
process
> > rather than a single material (e.g. Flux).
> >
> > This includes a recommended bias of 5v based upon a gradient of 25v/mm.
The
> > reason for this is based upon science research led by the NPL that
showed
> > lower voltage actually increased the effects of electro-chemical
migration.
> >
> > The measurement voltage is also recommended to be at 5v with no reverse
> > bias.
> >
> > The purpose is to try and test under conditions that most accurately
> > reflect
> > what your product is doing in real life.
> >
> > Testing using the old standards may well yield unrealistic results. As a
> > further example, no-clean fluxes tested at 85/85 would be volatilised
off
> > the surface at this elevated temperature. New recommendations now under
> > consideration are to test no-cleans at 40C/93RH - that way we can better
> > see
> > if there are any ECM issues.
> >
> > The dielectric withstand in CC-830 requires the coating to be tested to
> > TM-650 2.5.7.1 and "there shall be no disruptive discharge evidenced by
> > flash-over (surface discharge), sparkover (air discharge) or breakdown
> > (puncture discharge). The leakage rate shall not exceed 10
microamperes."
> >
> > I hope this helps
> >
> > --
> > Regards Graham Naisbitt
> >
> > [log in to unmask]
> >
> > GEN3 SYSTEMS LIMITED (Formerly Concoat Systems)
> > Unit B2 Armstrong Mall
> > Southwood Business Park
> > Farnborough, Hampshire GU14 0NR
> >
> > Phone: +44 (0)12 5252 1500
> > Fax: +44 (0)12 5252 1112
> >
> > www.gen3systems.com
> >
> >
> >
> >
> > On 8/3/06 19:49, "Joyce Koo" <[log in to unmask]> wrote:
> >
> >> Dear SIR,
> >> could you kindly provide the update info regarding the maximum bias for
> > the
> >> conformal coating SIR test? Is it still 333 V/mm? assume I use read
out
> > at
> >> 100 Vdc and bias at 50 Vdc for the B-25A, am I right that bias max is
> >> 333V/mm and read out is at 666V/mm spacing? Thank you very much.
> >> Best regards,
> >> jk
> >> ps. I know Concoat recommend low voltage bias, but the current test
> > method
> >> 650-2.6.3.4 is still high voltage. (50Vdc bias)... by the way, anyone
> > has
> >> table regarding the dielectric withstanding voltage per IPC-CC-830?
Many
> >> thanks.)
> >>
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