According to *4.3.3.3 in IPC 9701, for data loggers, failure is defined as
a maximum of 20% nominal resistance increase within a maximum of five
consecutive scans.

But the TCR of the daisy chains copper conductors  is 3900 ppm/C,
therefor, the  ohmic resistance readings at 100 C will increase by more
than 20% of the nominal resistance, taken at the start of the test, at room
temperature.

Thus this imply that the nominal resistance and all the other resistance
measurements shoul be taken at the same temperature?

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