TECHNET Archives

May 2005

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Condense Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Sender:
Subject:
From:
Kirshenbaum Mordechai <[log in to unmask]>
Date:
Wed, 4 May 2005 16:22:06 -0500
Reply-To:
TechNet E-Mail Forum <[log in to unmask]>, Kirshenbaum Mordechai <[log in to unmask]>
Parts/Attachments:
text/plain (22 lines)
According to *4.3.3.3 in IPC 9701, for data loggers, failure is defined as
a maximum of 20% nominal resistance increase within a maximum of five
consecutive scans.

But the TCR of the daisy chains copper conductors  is 3900 ppm/C,
therefor, the  ohmic resistance readings at 100 C will increase by more
than 20% of the nominal resistance, taken at the start of the test, at room
temperature.

Thus this imply that the nominal resistance and all the other resistance
measurements shoul be taken at the same temperature?

---------------------------------------------------
Technet Mail List provided as a service by IPC using LISTSERV 1.8e
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Technet
To temporarily halt or (re-start) delivery of Technet send e-mail to [log in to unmask]: SET Technet NOMAIL or (MAIL)
To receive ONE mailing per day of all the posts: send e-mail to [log in to unmask]: SET Technet Digest
Search the archives of previous posts at: http://listserv.ipc.org/archives
Please visit IPC web site http://www.ipc.org/contentpage.asp?Pageid=4.3.16 for additional information, or contact Keach Sasamori at [log in to unmask] or 847-615-7100 ext.2815
-----------------------------------------------------

ATOM RSS1 RSS2