Hi everybody,

if I get it right, there are chances that the dwell times be longer than the active times. In this case, the reliability tests based on cycling tend to be prohibitively long. So, besides costs from recycling fees and costlier materials, the companies will have to budget in longer time to market and eventually costlier tests.

Aren't there any other alternatives? I remember back in school that for gears, the temp cycling was significantly reduced by applying stress on the tested train. In electronics there are all the HAST, HATS, etc. Can't they be used, or modified, so that the temp cycling be reduced?

Best regards,
Ioan



-------------------------------------------------------------------------------Leadfee Mail List provided as a service by IPC using LISTSERV 1.8d
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Leadfree
To temporarily stop/(start) delivery of Leadree for vacation breaks send: SET Leadfree NOMAIL/(MAIL)
Search previous postings at: http://listserv.ipc.org/archives
Please visit IPC web site http://www.ipc.org/contentpage.asp?Pageid=4.3.16 for additional information, or contact Keach Sasamori at [log in to unmask] or 847-615-7100 ext.2815
-------------------------------------------------------------------------------