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June 2004

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Subject:
From:
"Marsico, James" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Wed, 23 Jun 2004 10:10:15 -0400
Content-Type:
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text/plain (134 lines)
Thermal stress of PWB coupons is different than what I'm referring to.  The
thermal shock I'm talking about is typically performed in an environmental
chamber (or chambers).  Basically, you have two chambers, one ant a low
temperature, the other at a high temperature.  After a predetermined time in
one chamber, the test sample is removed and placed into the other.  The
temperature change rate (ramp) is quite high (fast).  Thermal cycling, on
the other hand, usually takes place in a programmable chamber with
pre-programmed high and low temperature extremes and a controlled ramp rate
like 5 degrees C per minute.
Hope this clarifies things.

Jim Marsico
Senior Engineer
Production Engineering
EDO Electronics Systems Group
[log in to unmask] <mailto:[log in to unmask]>
631-595-5879


        -----Original Message-----
        From:   Paulus, Jim [SMTP:[log in to unmask]]
        Sent:   Wednesday, June 23, 2004 9:37 AM
        To:     [log in to unmask]
        Subject:        Re: [TN] Antw: [TN] Shock vs. Cycling

        What is the difference between "thermal shock" and "thermal stress",
        which is generally a coupon that is floated or dipped into solder
for 10
        or 20 secs at 500 or 550F?
        Thanks,
        Jim Paulus
        at Itron: 507-837-4326
        at office: 608-787-0817


        -----Original Message-----
        From: Guenter Grossmann [mailto:[log in to unmask]]
        Sent: Wednesday, June 23, 2004 2:28 AM
        To: [log in to unmask]
        Subject: [TN] Antw: [TN] Shock vs. Cycling

        James

        The results you will achieve will be totally different and specific
to
        the test.
        In thermal shock deformation and  degradation mechanisms will be
        activated that are irrelevant in thermal cycling and vice versa.
        - Degradation in solder joints depends on the strain rate
        - The degradation path in solder joints can be influenced by the
stress
        applied. And, the higher the strain rate the higher the stress.
        - Thermal shock can lead to the destruction of the components
something
        that will not occur in thermal cycling
        - Due to thermal shock the substrate will bend or warp and bring in
        additional stress into the component and the joints not occurring in
        thermal cycling

        If your application includes thermal shock you must test the
specimen
        accordingly if the stress is thermal cycling, thermal cycling is the
        test you have to do otherwise it is impossible to make any
connection
        between the test results and the real application. I do have even
doubts
        about the validity of comparative tests done with thermal shock if
no
        thermal shock occurs in the application (see above).

        Best regards

        Guenter

        EMPA
        Swiss Federal Laboratories  for Materials Testing and Research
        Centre for Reliability
        Guenter Grossmann,  Senior Engineer

        8600 Duebendorf
        Switzerland

        Phone: xx41 1 823 4279
        Fax :     xx41 1 823 4054
        mail:     [log in to unmask]

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