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| Reply To: | TechNet E-Mail Forum. |
| Date: | Mon, 21 Jun 2004 11:45:50 -0500 |
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Hi folks! The current sampling methodology used by JSTD-002 and JSTD-003 is
to document/follow/use a statistically valid sample size. The exact value
of what that sample size will be depends on a number of factors including
population size (the specification's are silent on an exact number because
of this). There are a number of industry recognized specifications (both
IPC and MIL) and statistical texts (Crosby, etc.) that can be used to setup
a sampling plan.
Dave Hillman
JSTD-002/003 Chairman
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Graham Naisbitt
<Graham.Naisbitt@CON To: [log in to unmask]
COAT.CO.UK> cc:
Sent by: TechNet Subject: Re: [TN] sample size for component solderability testing
<[log in to unmask]>
06/21/2004 10:08 AM
Please respond to
"TechNet E-Mail
Forum."; Please
respond to Graham
Naisbitt
Hi Susan
That is a good question. Could you let me know if you get an answer because
I also need that for the IEC standard now in revision.
I guess there is some standard "sampling rate" somewhere out there......?
--
Regards Graham Naisbitt
Golf Quote of the week: I had a wonderful experience on the golf course
today. I had a hole in nothing. Missed the ball and sank the divot!
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> Good Morning
> Do any of you know where I could find sample sizes for number of
components
> to be solderability tested out of a lot?
>
> Thanks
> Susan Mansilla
> Robisan Lab
>
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