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March 2010

TGAsia@IPC.ORG

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Subject:
From:
TL Zhang <[log in to unmask]>
Reply To:
Asia Committe Task Group Forum <[log in to unmask]>, [log in to unmask]
Date:
Tue, 16 Mar 2010 09:43:10 +0800
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CAF Testing 就是对电子产品的Anti-CAF 功能进行那个测试(一般多针对PCB板),
也叫耐离子迁移性测试。对材料进行高温高湿的连续处理,在处理的过程中,对电子
产品的一些规定点进行电性能测试,一般认为当测试点间的电阻率下降了10%,则该
处的CAF性能失效,此时对材料的处理时间即为该材料的CAF测试值,这个值根据材料
特性、测试条件的不同而不同,当然,不论什么情况,测试时间都是越长越好。

EVAN Zhang



孙该贤 <[log in to unmask]> 
发件人:  TGAsia <[log in to unmask]>
2010-03-16 09:12
请答复 给
Asia Committe Task Group Forum <[log in to unmask]>; 请答复 给
孙该贤 <[log in to unmask]>


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[TGAsia] CAF testing






请教大家一个问题,什么是CAF testing?
 
Sunny Sun 
Quality Dept 
Amphenol
Guangzhou Amphenol Sincere Flex Circuits
Tel: 86-20-3483-9838
Fax: 86-20-3483-9800
Mobil: 13798074592
Email: [log in to unmask]
 
 
 

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