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Reply To: | TechNet E-Mail Forum. |
Date: | Thu, 26 Aug 1999 21:53:44 -0400 |
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Phil Dutton wrote:
>
> Hello,
> I was just wondering how people are dealing with ICT.
> There is a big trend here (over the past year) to provide 100% nodal access
> for ICT.
> A big problem is littering the secondary side of the boards with suitable
> test pads, taking up valuable routing area.
> Often with SMT, the only vias on many of the nets, are to provide the test
> point. (single sided probing fixtures)
> I can see there are some benefits of 100% ICT, but from a designer's point
> of view, we seem to be trading off the benefits of finer pitch devices.
>
Welcome to modern producibility.
You can't ramp up production without automated test, if
there's any kind of complexity to the product.
You can't effectively do automated test without access to
every functional pin of every device.
The fun part? You should be providing access to unused
functional pins as well.
It's an opportunity to excel! The next step is to work up
good verification of fixturing rules and then proper data
handoff...
--
Jeff Seeger Applied CAD Knowledge Inc
Chief Technical Officer Tyngsboro, MA 01879
jseeger "at" appliedcad "dot" com 978 649 9800
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