On Tue, 09 Jul 1996 04:19:53 EDT  
Dougal Stewart <[log in to unmask]> asked:
>
>    We performed HAST (highly accelerated stress testing) on product
>    for a particular customer some years ago, which was designed to
>    take the product to failure in order that failure modes could be
>    analysed and product life determined. Does anyone out there
>    recognise the term HAST, and if so could you provide details
>    (non-proprietary) on what the testing involved. We are particularly
>    interested in relation to the new types of circuit constructions
>    with micro blind vias (SBU, laser drilled, Dyconex etc).

I'm vaguely familar with the HAST test procedure for plastic encapsulated
microcircuits.  See JEDEC standard 22-A110 for a test method.  The test is
based upon studies which show that you can evaluate the long term effects of
moisture on a device in an accelerated environment of temperature, humidity,
pressure and electrical bias.  An 85degC/85%RH/1000hour test can be reduced
to 25 hours.  A good source for info on this testing is a manufacturer of
the equipment, Express Test Corporation, San Fernando CA USA, telephone
+1.818.365.9200

-Gregg Klawson
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