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From [log in to unmask] Tue Jul 9 08: |
41:12 1996 |
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On Tue, 09 Jul 1996 04:19:53 EDT
Dougal Stewart <[log in to unmask]> asked:
>
> We performed HAST (highly accelerated stress testing) on product
> for a particular customer some years ago, which was designed to
> take the product to failure in order that failure modes could be
> analysed and product life determined. Does anyone out there
> recognise the term HAST, and if so could you provide details
> (non-proprietary) on what the testing involved. We are particularly
> interested in relation to the new types of circuit constructions
> with micro blind vias (SBU, laser drilled, Dyconex etc).
I'm vaguely familar with the HAST test procedure for plastic encapsulated
microcircuits. See JEDEC standard 22-A110 for a test method. The test is
based upon studies which show that you can evaluate the long term effects of
moisture on a device in an accelerated environment of temperature, humidity,
pressure and electrical bias. An 85degC/85%RH/1000hour test can be reduced
to 25 hours. A good source for info on this testing is a manufacturer of
the equipment, Express Test Corporation, San Fernando CA USA, telephone
+1.818.365.9200
-Gregg Klawson
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