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June 2003

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TechNet <[log in to unmask]>
Subject:
Re: Technical Question about Materials Labs
From:
Steve Gregory <[log in to unmask]>
Date:
Fri, 6 Jun 2003 16:12:44 EDT
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"TechNet E-Mail Forum." <[log in to unmask]>, [log in to unmask]
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Hi George!

Me not being much of a lab person, I got a response to my trace thickness
post recently, that XRF is not a good tool to measure copper trace thickness. Is
this true?

Thanks!

-Steve Gregory-

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