TECHNET Archives

August 2016

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Condense Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Sender:
X-To:
TechNet E-Mail Forum <[log in to unmask]>, Bev Christian <[log in to unmask]>
Date:
Tue, 2 Aug 2016 06:32:35 -0400
Reply-To:
TechNet E-Mail Forum <[log in to unmask]>, "Gerald Bogert (Contractor)" <[log in to unmask]>
Subject:
From:
"Gerald Bogert (Contractor)" <[log in to unmask]>
Message-ID:
In-Reply-To:
<73BDD7F3E82646A0B8BE23C43859EB0F@bev1a0f3c0a9bc>
Content-Type:
text/plain; charset=UTF-8
MIME-Version:
1.0
Parts/Attachments:
text/plain (49 lines)
August 2, 2016

The SAE has developed a new standard for using FTIR for counterfeit
electronic part detection.  It is AS6171/9 of SAE AS6171., have passed
ballot and have been sent to SAE Content Management for formatting, prior
to being submitted to Aerospace Council for final approval, and hopefully
the documents will be released later this year.  Once the documents are
published, SAE intent is to publish SAE AS6081 revision A which will
default to the inspection and test requirements of AS6171 with appropriate
slash sheets.  AS6081 applies to open market EEE part distributors (e.g.,
independent distributors, brokers).

On Mon, Aug 1, 2016 at 3:41 PM, Bev Christian <[log in to unmask]>
wrote:

> All, I should elaborate and say that the method is about using infra-red
> spectroscopy for material identification, usually organic materials.  FTITR
> is just a method of collecting and "averaging" many spectra to get much,
> much better signal to noise ratios.
> Regards,
> Bev
>
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]] On Behalf Of Bev Christian
> Sent: Monday, August 01, 2016 12:08 PM
> To: [log in to unmask]
> Subject: Re: [TN] FTIR
>
> Graham
> 2.3.39C CANCELLED.  This is the only one that I am familiar with.  What is
> your problem/issue you are trying to solve?
> Regards,
> Bev
>
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]] On Behalf Of Graham Naisbitt
> Sent: Monday, August 01, 2016 11:57 AM
> To: [log in to unmask]
> Subject: [TN] FTIR
>
> Hello fellow Techies,
>
> Do any of you know if there is a test method in IPC for FTIR?
>
> Thanks in advance
>
> Graham Naisbitt
>

ATOM RSS1 RSS2