Sender: |
|
X-To: |
|
Date: |
Wed, 24 Mar 2004 09:46:42 -0500 |
Reply-To: |
|
Subject: |
|
From: |
|
Content-Transfer-Encoding: |
7bit |
In-Reply-To: |
|
Content-Type: |
text/plain; charset="iso-8859-1" |
MIME-Version: |
1.0 |
Parts/Attachments: |
|
|
Andrew, it has been a few years since I've looked into this, but a standard
aging test for semiconductors was the so called 85/85 - 85 C and 85% for
1000 hours. IBM had some PCB aging tests, the details of which I forget,
that involved cycling humidity and temperature over a period of some weeks,
while monitoring the resistance between conductive traces, internal and
external. 10+ years ago Wayne Nelson published a handbook of accelerated
life testing. The last I heard, the main interest was in HAST and HALT
testing, Highly Accelerated Stress and Life. Some models had been worked up
by researchers. A fundamental question to ask is what materials are you
testing and what failure mechanisms are you concerned about? Lou Hart
-----Original Message-----
From: TechNet [mailto:[log in to unmask]]On Behalf Of Andrew Medina
Sent: Wednesday, March 24, 2004 8:39 AM
To: [log in to unmask]
Subject: [TN] ACCELERATED AGING TEST
Importance: High
---------------------------------------------------
Technet Mail List provided as a service by IPC using LISTSERV 1.8e
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Technet
To temporarily halt or (re-start) delivery of Technet send e-mail to [log in to unmask]: SET Technet NOMAIL or (MAIL)
To receive ONE mailing per day of all the posts: send e-mail to [log in to unmask]: SET Technet Digest
Search the archives of previous posts at: http://listserv.ipc.org/archives
Please visit IPC web site http://www.ipc.org/contentpage.asp?Pageid=4.3.16 for additional information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315
-----------------------------------------------------
|
|
|