Hello all, this is an interesting question.
In G. Theodore Dangelmayer's text, ESD Program Management, page 351,
Demonstration # 3 Cumulative Damage. Ted's experimental goal in this example
is to demonstrate the reality of cumulative damage to sensitive devices and
the reliability implications.
In the experiment he goes on to show a particular devices with a threshold
value of 1,000 volts, when handled a multitude of times will fail at 900
volts. He states "... 900 volts will eventually destroy the device.
So the point is, ESD damage is cumulative and should be considered as such
by all programs.
For your information Ted Dangelmayer was the ESD guru at Lucent
technologies, a member of the ESD Association Board of Directors, plus many
more. His book is a resource to all involved in ESD.
Leo Lambert
Tech Director
EPTAC Corp
Amherst NH
603-673-7822 ext 15
[log in to unmask]
-----Original Message-----
From: TechNet [mailto:[log in to unmask]]On Behalf Of Dieselberg, Ron
Sent: Monday, October 06, 2003 3:24 PM
To: [log in to unmask]
Subject: Re: [TN] Cumulative damage from ESD
Yes, we used to use that video as a training tape years ago.
Ron Dieselberg
Trainer
CMC Electronics Cincinnati
[log in to unmask]
-----Original Message-----
From: Martyn Gaudion [mailto:[log in to unmask]]
Sent: Thursday, October 02, 2003 19:05 PM
To: [log in to unmask]
Subject: Re: [TN] Cumulative damage from ESD
Hi Alex,
I have like you always assumed it to be either or - If hit hard enough
device failure is catastrophic. But small discharges can also cause
degradation.
Some time ago (a long time ago !) I seem to remember 3M used to make a
sales presentation where they
gradually destroyed a Mosfet by handing sample devices around a group of
people, as the device was handed from person to person the gate leakage
current was measured after each handling. At each test
the gate leakage current gradually increased up to and beyond its spec,
then at some point the gate was demonstrated to have failed completely.
Does anyone else remember this type of presentation?
Kind regards
Martyn Gaudion
Polar Instruments
www.polarinstruments.com
T: +44 1481 253081
M: +44 7710 522 748
F: +44 1481 252476
E: [log in to unmask]
At 04:44 PM 02/10/03 -0600, you wrote:
Hi all. Simple question yet I havent read the definitive answer. Is
damage from ESD cumulative? Reason I ask is the following statement I came
across in a GaAs MMIC article.
Other studies have also concluded that damage from repeated exposure
to an ESD level is not cumulative and that noncatastrophic damage does not
degrade device lifetime. The statement references the EOS/ESD Symposium
Proceedings 1988.
Ive always preached that ESD damage is cumulative.
Alex ShockedKrstic
NovAtel Inc.
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