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November 1997

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Date:
Mon, 24 Nov 1997 21:32:48 -0500
Reply-To:
"TechNet Mail Forum." <[log in to unmask]>, Gregg Klawson <[log in to unmask]>
Subject:
Re: Plating integrity in small vias
From:
Gregg Klawson <[log in to unmask]>
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<971124212003_-388864981@mrin47>
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At 9:20 PM -0500 11/24/97, [log in to unmask] wrote:

[snip]

>That is why testing is done-- the new IST test is quick and correlates, at
>least qualitatively, with thermal cycling.
>
>Werner Engelmaier

[snip]

What is the new IST test?

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