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October 2012

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TechNet <[log in to unmask]>
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TechNet <[log in to unmask]>
Date:
Wed, 31 Oct 2012 12:09:16 +0200
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TechNet E-Mail Forum <[log in to unmask]>, Gönül Özden <[log in to unmask]>
Subject:
ionic contamination measurement
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Gönül Özden <[log in to unmask]>
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Hello,
 
I need to know which method in ionic contamination measurement will be more reliable and convenient for military application static process or dynamic process. IPC-TM-650 accept both metodologies. 
Can someone of you have an experience on this issue?

Regards

Gonul Ozden




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