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Wed, 31 Jul 96 10:53:00 PDT |
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| From [log in to unmask] Wed Jul 31 17: |
30:15 1996 |
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I am looking for a source for non-destructive inspection/analysis of
top-side solder fillets on a DC/DC converter, soldered flush to the PWA
(thru hole, single side). I have already attempted X-ray. Is the process
of Scanned-Beam Laminography (SBL) or Computed Tomography (CT) available
commercially for this application?
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