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1996

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Subject:
From:
"Rajan, Sanjay" <[log in to unmask]>
Date:
Mon, 11 Nov 96 11:52:00 EST
Content-Type:
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Ger,

In the past I have had good success with test chips for
thermal, mechanical and corrosion experiments from

1. Sandia National Labs., contact Jim Sweet @ (505) 845-8242
2. Delco Electronics, contact Dan Rodkey @ (317) 451-5011

I hope these phone numbers haven't changed since it is at
least a couple of years since I tried them.

Good luck

________________________________________________
Sanjay Rajan        RF Communications Division
Harris Corporation  Product Design Engineering
1680 University Avenue   Phone:    (716) 242-3923
Rochester, NY 14610 Fax: (716) 242-3174
________________________________________________

 ----------
From: Ger McCarthy
To: [log in to unmask]
Subject: RELIABILITY test chips
Date: Monday, November 11, 1996 11:17AM



I am looking to source commercially available electronic packaging
reliability test chips. I am particularly interested in test structures
such as Strain Gauges, Heaters and Temperature sensing diodes, corrosion
monitors and daisy chains. I know of a number of such test chips used in
reliability ecaluation studies, but I'm not aware of many which are
commercially
available. Any help greatly appreciated.

Ger McCarthy
National Microelectronics Research Centre,
Lee Maltings,                 Phone : +353-21-904088
Prospect Row,                     Fax   : +353-21-270271
Cork, Ireland.                    e-mail: [log in to unmask]
 ----------------------------------------------------------------

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