Werner,
You are right.  It is a burn-in and thanks for the input.
EG

-----Original Message-----
From:   Werner  Engelmaier [SMTP:[log in to unmask]]
Sent:   Sunday, May 23, 1999 5:15 AM
To:     [log in to unmask]
Subject:        Re: [TN] reliability testing on compliant pin technology

Hi EG,
You did not say what you are trying to accomplish with an environmental
stress screening of -15 to 60 deg C. As ESS goes, this is not much of a
screen, and I am seriously wondering if you accomplish anything at all. What
you do may serve as a Burn-In, but I can not imagine what latent defects you
would screen out with -15 to 60 deg C cycling-compliant pins or not- unless
you run it long enough to damage good product.

Werner Engelmaier
Engelmaier Associates, L.C.
Electronic Packaging, Interconnection and Reliability Consulting
7 Jasmine Run
Ormond Beach, FL  32174  USA
Phone: 904-437-8747, Fax: 904-437-8737
E-mail: [log in to unmask], Website: www.engelmaier.com

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