If anyone can help, please respond to Paul directly at 
[log in to unmask]

Thanks.


On Fri, 8 Nov 1996, Paul A. Rubino wrote:

> 
> Hello Dieter and Lisa:
> 
> 	Can you help me with this question?
> 
> Thanks,
> Paul
> 
> \_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_
> \_                                                                        \_
> \_ Paul A. Rubino                      Email:    [log in to unmask] \_
> \_ Lockheed Martin Corporation         MARCALL:  8*747-3025               \_
> \_ Astro Space                         Phone:    (610)354-3025            \_
> \_ Building 100, Room U2101            FAX:      (610)354-1261            \_
> \_ 230 Mall Boulevard                                                     \_
> \_ King of Prussia, PA 19406                                              \_
> \_                                                                        \_
> \_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_\_
> 
> 
> ----- Begin Included Message -----
> 
> 
> We are currently trying to purchase a Cyanate Ester pwb.  Our drawing
> specifies etchback per Mil-P-55110.  Our vendor has requested that we
> change to desmear instead.  The vendor says they will not etchback CE
> due to the scrap they incurr due to micro-cracking.
> 
> Has anyone else come across this issue?  What is the cause of the
> micro-cracking?  Does desmear cause microcracking?  Is there any
> reliability concerns with desmear vs. etchback? 
> 
> Please get back to me:
> 
> Ken Bruning
> 
> 
> 

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