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September 2000

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From:
Peter Menuez <[log in to unmask]>
Date:
Fri, 1 Sep 2000 18:55:07 -0700
MIME-Version:
1.0
X-To:
Franklin D Asbell <[log in to unmask]>
Reply-To:
"TechNet E-Mail Forum." <[log in to unmask]>, Peter Menuez <[log in to unmask]>
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Franklin,

Besides the problems with AOI that have been addressed
in several other emails there is a potential problem
of the AOI itself.  Most of the AOI's that I am
familiar with use 'design rule' checks rather than an
actual comparison of real data to real product.

Maybe someone out there in Technet Land could expand
on design rule checking because I don't know much
about it, but this alone would make me nervous.

Pete





--- Franklin D Asbell <[log in to unmask]>
wrote:
> Just read an article in "The Board Authority"
> regarding Automatic
> Optical Test (AOT).
>
> Just wondering what you assemblers or purchasers of
> bare boards thoughts
> are on fabricators performing 'optical testing'
> (visual, AOI)  instead
> of 'contact testing' (BON, probe)????
>
> An example: You state all boards to be electrically
> tested for
> opens/shorts, and instead of throwing the boards on
> our flying probe or
> bed-of-nails equipment I decide to put this on my
> AOI after setting it
> up to flag for opens/shorts, would you be satsified
> with this method?
>
> Franklin D Asbell
> Network Circuits, Inc.
> Irving, Texas 75061
>
>
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