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May 2006

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Subject:
From:
MA/NY DDave <[log in to unmask]>
Reply To:
(Leadfree Electronics Assembly Forum)
Date:
Mon, 22 May 2006 22:35:02 -0500
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text/plain (32 lines)
Hi J-P, Joe, Werner, ALL, IPC LF Listservers,

I have to read all your notes, yet in support of LF failures Tin Whiskers
has been reported as a real failure mechanism that is unique to Pb-free.
By that I mean we have more than just accelerated failures or modelling
failures.

One published failure is in space via NASA and another, I and we know of,
is in a  Nuclear Reactor facility in CT. I called them once or twice, yet
still have to do some more follow up.  If anyone else has done this please
Share.

We also should expect SnCu failures with P-I-Hole components, as well as
some chip capacitor end cap failures.

I do agree that hard published data is going to take some time to work
it's way to the public domain so that everyone will have some references.




Yours in Engineering, Dave
YiEngr, MA/NY DDave

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