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April 2006

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Subject:
From:
Tom Newton <[log in to unmask]>
Reply To:
D-50 Embedded Devices Committee Forum <[log in to unmask]>, Tom Newton <[log in to unmask]>
Date:
Mon, 10 Apr 2006 13:00:36 -0500
Content-Type:
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Colleagues:

As there has been no reportable progress with the Gage R&R testing for
the Test Method 2.5.7.2, "Dielectric Withstanding Voltage - Thin
Dielectric Layers for Printed Circuit Boards" (also called Hi Pot
testing), the D-54 Subcommittee leadership and IPC Staff liaison have
jointly decided that this month's teleconference will not be held.  

This D-54 Subcommittee teleconference would have been this Thursday,
April 13 at 3:00 - 4:00 pm CDT.  

Please do not call in. 

Thanks!

Tom Newton

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