In a message dated 5/24/99 10:56:13 AM Pacific Daylight Time, [log in to unmask] writes: << To all... I attemted to send this out Fri., but I don't think it went. I'll try again. My boss asked me if I knew anything about a "Board level testability analysis including the role of and use of JTAG"? I responded with an very educational DUH!!! Help, does anyone know what this is about??? Any help would be appreciated and thanks in advance. Regards, Bob Vanech Mango Computers (203) 857-4008 x108 >> Hi Bob! JTAG is a sorta kinda trade name that came about from a joint effort by certain companies, that's really talking about Boundry-scan testing. If you go to: http://www.corelis.com/products/scanovrv.html there will be a real good overview about Boundry-scan testing and what has to happen as far as design and whatnot in order to able to accomplish it. Below I've pasted a couple of paragraphs from that page that gives a general description about it... -Steve Gregory- Boundary-Scan Standard Background Boundary-scan, as defined by the IEEE-1149.1 standard, is an integrated method for testing interconnects on printed circuit boards that is implemented at the IC level. The inability to test highly complex and dense printed circuit boards using traditional in-circuit testers and bed of nail fixtures became evident in the mid eighties. Due to physical space constraints, fixturing cost increased dramatically while fixture reliability decreased at the same time. This problem has been further complicated by the growing use of complex custom application specific IC's (ASIC's) that require extensive test pattern sets. This not only increases test development cost, it also increases test times and decreases test coverage. In 1985, companies such as IBM, AT&T, Texas Instruments, Philips Electronics NV, Siemens, Alcatel, and Ericsson, recognizing the need for a uniform solution to these problems, took the initiative to overcome these issues and founded the Joint Test Action Group (JTAG). This initiative quickly led to a new boundary-scan testing (BST) method, adopted by the IEEE as Standard 1149.1 in 1990. Since that time, this standard has been adopted by major electronics companies all over the world. Applications are found in high volume, high-end consumer products, telecommunication products, defense systems, computers, peripherals, and avionics. Now, due to its economic advantages, smaller companies are starting to take advantage of BST. ################################################################ TechNet E-Mail Forum provided as a free service by IPC using LISTSERV 1.8c ################################################################ To subscribe/unsubscribe, send a message to [log in to unmask] with following text in the body: To subscribe: SUBSCRIBE TechNet <your full name> To unsubscribe: SIGNOFF TechNet ################################################################ Please visit IPC's web site (http://www.ipc.org) "On-Line Services" section for additional information. For technical support contact Hugo Scaramuzza at [log in to unmask] or 847-509-9700 ext.312 ################################################################