I am looking for a source for non-destructive inspection/analysis of top-side solder fillets on a DC/DC converter, soldered flush to the PWA (thru hole, single side). I have already attempted X-ray. Is the process of Scanned-Beam Laminography (SBL) or Computed Tomography (CT) available commercially for this application? *************************************************************************** * TechNet mail list is provided as a service by IPC using SmartList v3.05 * *************************************************************************** * To unsubscribe from this list at any time, send a message to: * * [log in to unmask] with <subject: unsubscribe> and no text. * ***************************************************************************