From: Stephen Ayotte \\\\\\\EM Quality Engineering \\\\\\\Bldg. 14-3 Col F5 5-1537 Subject: There are a number of good articles on CAF that I have seen. Given the amount of discussion lately on the military failure and CAF I thought these might be beneficial. Circuit World Vol 21 No. 4 1995 pgs. 1-9 "Microstructure of Conductive Anodic Filaments Formed during Accelerated Testing of Printed Wiring Boards" authors - Ready, Stock, Freeman, Dollar and Turbini and its associated references. **** IBM MD Product Quality Engineer**** **** OEM Quality Engineer ****