Within the last couple of days there was an extremely valuable note posted to TechNet detailing various studies on reliability of plastic encapsulated microcircuits (PEM). Due to an anomaly in cyberspace, my copy of the note was deleted prior to filing the note or obtaining a hard copy. Please repost article THANX!!! *************************************************************************** * TechNet mail list is provided as a service by IPC using SmartList v3.05 * *************************************************************************** * To unsubscribe from this list at any time, send a message to: * * [log in to unmask] with <subject: unsubscribe> and no text. * ***************************************************************************