In a previous life we used XRF to measure plating
thickness on relay contacts, etc. It was good for measuring the thickness of a
known alloy over that of another known alloy, provided the materials were dissimilar enough for the machine to distinguish between them. The machine needed known samples of the plated alloy over the base alloy in order to be
regularly calibrated (daily, if I remember correctly). Now, these machines were
quite old when we had them, so newer technology may be better.
Blair Hogg
QA Manager
GAI-Tronics Corp.
>>>
[log in to unmask] 06/06/03 04:12PM
>>>
Hi George!
Me not being much of a lab person, I got a
response to my trace thickness post recently, that XRF is not a good tool to
measure copper trace thickness. Is this
true?
Thanks!
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