XRF is not intended for copper trace thickness.
It is used for measuring things like the gold and nickel thickness
over copper fingers, or solder thickness on copper pads.
One great device for trace height is the Cyberoptics laser
profilometer.  It will measure height of copper above laminate.
It will not measure LPI soldermask as it is too translucent.
  -----Original Message-----
  From: TechNet [mailto:[log in to unmask]]On Behalf Of Steve Gregory
  Sent: Friday, June 06, 2003 4:13 PM
  To: [log in to unmask]
  Subject: Re: [TN] Technical Question about Materials Labs


  Hi George!

  Me not being much of a lab person, I got a response to my trace thickness
post recently, that XRF is not a good tool to measure copper trace
thickness. Is this true?

  Thanks!


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