XRF is not intended for copper trace thickness. It is used for measuring things like the gold and nickel thickness over copper fingers, or solder thickness on copper pads. One great device for trace height is the Cyberoptics laser profilometer. It will measure height of copper above laminate. It will not measure LPI soldermask as it is too translucent. -----Original Message----- From: TechNet [mailto:[log in to unmask]]On Behalf Of Steve Gregory Sent: Friday, June 06, 2003 4:13 PM To: [log in to unmask] Subject: Re: [TN] Technical Question about Materials Labs Hi George! Me not being much of a lab person, I got a response to my trace thickness post recently, that XRF is not a good tool to measure copper trace thickness. Is this true? Thanks! --------------------------------------------------- Technet Mail List provided as a free service by IPC using LISTSERV 1.8e To unsubscribe, send a message to [log in to unmask] with following text in the BODY (NOT the subject field): SIGNOFF Technet To temporarily halt or (re-start) delivery of Technet send e-mail to [log in to unmask]: SET Technet NOMAIL or (MAIL) To receive ONE mailing per day of all the posts: send e-mail to [log in to unmask]: SET Technet Digest Search the archives of previous posts at: http://listserv.ipc.org/archives Please visit IPC web site http://www.ipc.org/html/forum.htm for additional information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315 -----------------------------------------------------