Been down this road, and all others associated with failure modes, mechanisms, effects, and the analysis thereof. Sure, the possibility exists. So do many others. I placed a report/presentation on a ftp site some time back. It included all the analysis I had done concerning GaAs FET amplifier failures. There are about ten or so blank pages where the ESD failures were supposed to go. Aganin, the pages were blank. I had two labs do ESD (both LCD and SEM search), PIND, Acoustic Microscopy, RGA, SEM, EDX, X-section, X-Ray, thermal, mechanical, and all other viable tests pertaining to these devices, in accordance with MIL-STD-883E, and found the failure mechanism to be a single PCB design issue with a little help from just a few suspect prototype components. The component and design issues were resolved and the assembly did as specified. MoonMan --------------------------------------------------------------------------------- Technet Mail List provided as a free service by IPC using LISTSERV 1.8d To unsubscribe, send a message to [log in to unmask] with following text in the BODY (NOT the subject field): SIGNOFF Technet To temporarily halt delivery of Technet send e-mail to [log in to unmask]: SET Technet NOMAIL To receive ONE mailing per day of all the posts: send e-mail to [log in to unmask]: SET Technet Digest Search previous postings at: www.ipc.org > On-Line Resources & Databases > E-mail Archives Please visit IPC web site http://www.ipc.org/html/forum.htm for additional information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315 ---------------------------------------------------------------------------------