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December 1999

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Subject:
From:
"David L. Morrow" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 21 Dec 1999 08:37:26 EST
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In a message dated 12/20/99 9:21:09 PM US Eastern Standard Time,
[log in to unmask] writes:

<< Both the testing and the modeling need to be specific for
 the failures you are interested in, e.g. solder joints,plated-through
 holes/vias, components, insulation resistance, etc. >>

Werner hit the nail on the head.  However, I would like to add that the
testing and modeling need also to be specific for the product design and the
field environment for which it is designed.

David Morrow
Contamination Studies Laboratories. Inc.

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