Wolfgang,

I have the same concerns and issues as you. We have been faced with
complaints of ICT failures due to TPvias not being probed whereas there is
no definition or distinguishing factors that separate vias and endpoint
vias. To add to this, several of our long term customers have supplied
aperture sizes specific to TPvias but have added a new design house that
did not define these vias. To many variables are leaving the test world to
second guess design and testability.

Taking notice to the responses before mine, I seen the words "most have",
"could be", "usually are", in those statements. To those gentlemen, please
don't take offense, I point these out as the variables I mentioned.

For us to do our job correctly and accurately, a standard definition would
be perfect. I had stated this to designers during the IPC BBT expo in May
99 with little positive response. This is one of many issues where it has
become imperative for the test and design worlds to converge and together
deliver the product our customers expect and deserve.

Blaine R. Shelkey
Test Engineering Manager
TYCO PCG/Melbourne
600D John Rodes Blvd.
Melbourne, Fl. 32934

321.308.8843 (Ph)
321.308.8868 (Fax)
Email: [log in to unmask]
<http://www.iu.net/aqc>

##############################################################
TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c
##############################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in
the body:
To subscribe:   SUBSCRIBE TECHNET <your full name>
To unsubscribe:   SIGNOFF TECHNET
##############################################################
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional
information.
If you need assistance - contact Gayatri Sardeshpande at [log in to unmask] or
847-509-9700 ext.5365
##############################################################