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Reply To: | TechNet E-Mail Forum. |
Date: | Thu, 28 Oct 1999 20:59:58 EDT |
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Hi Chetan,
I was approached this week during IPCWorks about the formation of a task
group on the reliability of plated-through holes (PTHs) and vias (PTVs) in
multilayer flex and flex-rigid circuits. This directly would address your
recent concern regarding the PTV reliability and the appropriatness of using
T-stress testing. Would you, and anybody else interested in this, please
contact Sarah Zarrin, Seagate Technology, 612-402-3661, fax 612-402-2044,
[log in to unmask] She volunteered to chair such an activity.
Werner Engelmaier
Chairman, IPC Reliability Main Committee
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